DocumentCode :
3138143
Title :
Wavelength selective wide bandgap II-VI detectors
Author :
Ehinger, M. ; Korn, M. ; Schallenberg, T. ; Faschinger, W. ; Landwehr, G.
Author_Institution :
Wurzburg Univ., Germany
fYear :
1999
fDate :
1999
Firstpage :
167
Lastpage :
170
Abstract :
In modern technology there is a growing demand for wavelength selective, highly sensitive detectors in the visible spectral range, especially for short wavelengths. II-VI wide gap PIN photodiodes have been fabricated using ZnMgSSe and ZnSTe heterostructures grown by molecular beam epitaxy (MBE). These diodes have excellent structural and interface quality and a high external quantum efficiency (QE) of up to 60%, which is dose to the theoretical limit. Devices which use a p-type layer as a “built in band edge filter” for wavelengths shorter than the energy gap have a spectral response with a full width at half maximum (FWHM) down to 6.5 nn and a QE of 10%. The shape of the spectral response and the stray signal rejection is comparable to metal-dielectric type bandpass filters with an optical density of 4 for the ultraviolet. Due to the high external QE and a low dark current below 0.1 pA/mm2, II-VI wide gap hetero PIN photodiodes surpass UV optimized Si detectors and filter detector combinations with bandwidths between 20 nm and 80 nm in detectivity in the UV spectral range
Keywords :
II-VI semiconductors; molecular beam epitaxial growth; p-i-n photodiodes; photodetectors; wide band gap semiconductors; zinc compounds; 10 percent; 60 percent; PIN photodiode; UV detector; ZnMgSSe; ZnMgSSe heterostructure; ZnSTe; ZnSTe heterostructure; built-in band-edge filter; dark current; external quantum efficiency; interface structure; molecular beam epitaxy; quantum efficiency; visible detector; wavelength selective photodetector; wide bandgap II-VI semiconductor; Band pass filters; Detectors; Diodes; Molecular beam epitaxial growth; Optical filters; Optical sensors; PIN photodiodes; Photonic band gap; Quantum mechanics; Shape;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Optoelectronic and Microelectronic Materials Devices, 1998. Proceedings. 1998 Conference on
Conference_Location :
Perth, WA
Print_ISBN :
0-7803-4513-4
Type :
conf
DOI :
10.1109/COMMAD.1998.791611
Filename :
791611
Link To Document :
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