Title :
Frequency dependence of measurement precision in two dielectric resonator method for estimating surface resistance of high-Tc superconductor films
Author :
Kobayashi, Yoshio ; Yoshikawa, Hiromichi ; Hashimoto, Toru
Author_Institution :
Dept. of Electr. & Electron. Syst., Saitama Univ., Urawa, Japan
Abstract :
A two dielectric resonator method using two sapphire-rod resonators has been proposed as the most promising method to measure surface resistance Rs of high-Tc superconductor films precisely. In this paper, the frequency dependence of the Rs measurement precision is estimated analytically, taking account of the frequency dependences of tanδ of sapphire and Rs of YBCO films in the frequency range from 10 to 50 GHz. The temperature dependence of Rs for YBCO films was measured at 20 GHz. The measurement precision of Rs=0.16 mΩ at 20 K was estimated to be 5 percents
Keywords :
barium compounds; dielectric resonators; electric resistance measurement; high-temperature superconductors; microwave measurement; superconducting thin films; surface conductivity; yttrium compounds; 10 to 50 GHz; 20 K; Al2O3; YBCO film; YBaCuO; dielectric loss tangent; frequency dependence; high-Tc superconductor; measurement precision; sapphire rod resonator; surface resistance; temperature dependence; two dielectric resonator method; Dielectric measurements; Electrical resistance measurement; Frequency dependence; Frequency estimation; Frequency measurement; High temperature superconductors; Superconducting films; Surface resistance; Temperature dependence; Yttrium barium copper oxide;
Conference_Titel :
Microwave Conference, 2000 Asia-Pacific
Conference_Location :
Sydney, NSW
Print_ISBN :
0-7803-6435-X
DOI :
10.1109/APMC.2000.926138
