Frequency dependence of measurement precision in two dielectric resonator method for estimating surface resistance of high-Tc superconductor films

Author

Kobayashi, Yoshio ; Yoshikawa, Hiromichi ; Hashimoto, Toru

Author_Institution

Dept. of Electr. & Electron. Syst., Saitama Univ., Urawa, Japan

fYear

2000

fDate

2000

Firstpage

1564

Lastpage

1567

Abstract

A two dielectric resonator method using two sapphire-rod resonators has been proposed as the most promising method to measure surface resistance R_s of high-Tc superconductor films precisely. In this paper, the frequency dependence of the R_s measurement precision is estimated analytically, taking account of the frequency dependences of tanδ of sapphire and R_s of YBCO films in the frequency range from 10 to 50 GHz. The temperature dependence of R_s for YBCO films was measured at 20 GHz. The measurement precision of R_s=0.16 mΩ at 20 K was estimated to be 5 percents

Keywords

barium compounds; dielectric resonators; electric resistance measurement; high-temperature superconductors; microwave measurement; superconducting thin films; surface conductivity; yttrium compounds; 10 to 50 GHz; 20 K; Al₂O₃; YBCO film; YBaCuO; dielectric loss tangent; frequency dependence; high-Tc superconductor; measurement precision; sapphire rod resonator; surface resistance; temperature dependence; two dielectric resonator method; Dielectric measurements; Electrical resistance measurement; Frequency dependence; Frequency estimation; Frequency measurement; High temperature superconductors; Superconducting films; Surface resistance; Temperature dependence; Yttrium barium copper oxide;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Conference, 2000 Asia-Pacific

Conference_Location

Sydney, NSW

Print_ISBN

0-7803-6435-X

Type

conf

DOI

10.1109/APMC.2000.926138

Filename

926138