DocumentCode :
3138261
Title :
Imaging of Electrode Movement and Conductivity Change in Electrical Impedance Tomography
Author :
Gomez-Laberge, Camille ; Adler, Andy
Author_Institution :
Sch. of Inf. Technol. & Eng., Ottawa Univ., Ont.
fYear :
2006
fDate :
38838
Firstpage :
975
Lastpage :
978
Abstract :
Electrical impedance tomography (EIT) applies and measures electrical energy on the boundary of a medium to produce an image of its internal impedance distribution. In many medical applications, such as imaging of the chest, the electrodes move during measurements, introducing artefacts into the calculated images. This paper proposes a new algorithm that compensates for electrode movement during difference EIT measurements. The reconstructed image is calculated by regularizing the image reconstruction matrix based on the sensitivity and smoothness of the conductivity and movement data. A comparison of the standard and proposed EIT reconstruction methods is made. Images are reconstructed from 2D and 3D simulations exhibiting conductivity changes and electrode movements. Results show the proposed method yields a good estimation of electrode movement and a significant improvement in conductivity image reconstructions
Keywords :
electric impedance imaging; image reconstruction; matrix algebra; medical image processing; conductivity change imaging; electrical impedance tomography; electrode movement imaging; image reconstruction matrix regularization; medical application; Biomedical electrodes; Biomedical equipment; Conductivity; Electric variables measurement; Energy measurement; Image reconstruction; Impedance measurement; Medical services; Motion measurement; Tomography; Electrical impedance tomography; inverse problems; regularization;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical and Computer Engineering, 2006. CCECE '06. Canadian Conference on
Conference_Location :
Ottawa, Ont.
Print_ISBN :
1-4244-0038-4
Electronic_ISBN :
1-4244-0038-4
Type :
conf
DOI :
10.1109/CCECE.2006.277846
Filename :
4054756
Link To Document :
بازگشت