DocumentCode :
31383
Title :
Lifetime Extension Method for Active Matrix Organic Light-Emitting Diode Displays Using a Modified Stretched Exponential Decay Model
Author :
Kyonghwan Oh ; Seong-Kwan Hong ; Oh-Kyong Kwon
Author_Institution :
Dept. of Electron. Eng., Hanyang Univ., Seoul, South Korea
Volume :
36
Issue :
3
fYear :
2015
fDate :
Mar-15
Firstpage :
277
Lastpage :
279
Abstract :
In this letter, we propose a compensation method for organic light-emitting diode (OLED) degradation occurring in a digital driving scheme for active-matrix OLED displays. The proposed method, in which we are the first to propose, employs the modified stretched exponential decay (SED) model to characterize the OLED degradation and compensates for the associated luminance decrease; the lifetime of an OLED panel can thereby be extended. The OLED panel is fabricated using low-temperature poly-Si thin-film transistors, and measured to verify the modified SED model and the proposed compensation method. The measurement results show that the luminance degradation with and without the proposed method is 0.3% and 6%, 4% and 17.8%, and 7.4% and 30.4%, for red, green, and blue OLEDs, respectively. This measurement is taken after 40 h of operation under a 350 cd/m2 initial luminance. Accordingly, the proposed compensation method extends the lifetime of the OLED panel up to 72.5, 15.5, and 20.75 times longer in red, green, and blue OLEDs, respectively, compared with the conventional method.
Keywords :
LED displays; brightness; colour displays; compensation; organic light emitting diodes; polymer films; silicon; thin film transistors; OLED degradation; OLED panel; Si; active matrix OLED display; compensation method; digital driving scheme; lifetime extension method; low temperature poly-Si thin film transistor; luminance degradation; modified SED model; organic light emitting diode; red green and blue OLED; stretched exponential decay; Active matrix organic light emitting diodes; Degradation; Radiation detectors; Resistance; Table lookup; Thin film transistors; AMOLED; OLED degradation; compensation; digital driving; lifetime extension of AMOLED; stretched exponential decay model;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/LED.2015.2394451
Filename :
7017530
Link To Document :
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