• DocumentCode
    31383
  • Title

    Lifetime Extension Method for Active Matrix Organic Light-Emitting Diode Displays Using a Modified Stretched Exponential Decay Model

  • Author

    Kyonghwan Oh ; Seong-Kwan Hong ; Oh-Kyong Kwon

  • Author_Institution
    Dept. of Electron. Eng., Hanyang Univ., Seoul, South Korea
  • Volume
    36
  • Issue
    3
  • fYear
    2015
  • fDate
    Mar-15
  • Firstpage
    277
  • Lastpage
    279
  • Abstract
    In this letter, we propose a compensation method for organic light-emitting diode (OLED) degradation occurring in a digital driving scheme for active-matrix OLED displays. The proposed method, in which we are the first to propose, employs the modified stretched exponential decay (SED) model to characterize the OLED degradation and compensates for the associated luminance decrease; the lifetime of an OLED panel can thereby be extended. The OLED panel is fabricated using low-temperature poly-Si thin-film transistors, and measured to verify the modified SED model and the proposed compensation method. The measurement results show that the luminance degradation with and without the proposed method is 0.3% and 6%, 4% and 17.8%, and 7.4% and 30.4%, for red, green, and blue OLEDs, respectively. This measurement is taken after 40 h of operation under a 350 cd/m2 initial luminance. Accordingly, the proposed compensation method extends the lifetime of the OLED panel up to 72.5, 15.5, and 20.75 times longer in red, green, and blue OLEDs, respectively, compared with the conventional method.
  • Keywords
    LED displays; brightness; colour displays; compensation; organic light emitting diodes; polymer films; silicon; thin film transistors; OLED degradation; OLED panel; Si; active matrix OLED display; compensation method; digital driving scheme; lifetime extension method; low temperature poly-Si thin film transistor; luminance degradation; modified SED model; organic light emitting diode; red green and blue OLED; stretched exponential decay; Active matrix organic light emitting diodes; Degradation; Radiation detectors; Resistance; Table lookup; Thin film transistors; AMOLED; OLED degradation; compensation; digital driving; lifetime extension of AMOLED; stretched exponential decay model;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/LED.2015.2394451
  • Filename
    7017530