DocumentCode :
3138304
Title :
Understanding the effect of uncorrelated phase noise on the phase coherency of multi-channel RF vector signal analyzers
Author :
Hall, David A. ; Hinde, Andy
Author_Institution :
Nat. Instrum., Austin, TX, USA
fYear :
2010
fDate :
23-28 May 2010
Firstpage :
592
Lastpage :
597
Abstract :
While MIMO test setups historically used multiple vector signal analyzers (VSA´s) with a shared 10 MHz reference clock, the rise of modular RF instruments allow for a common local oscillator (LO) to be shared between each channel of a multi-channel VSA. In multi-channel VSA systems, a broad range of factors can introduce measured channel-to-channel phase variation including: uncorrelated LO phase noise, uncorrelated ADC sample clock phase noise, signal to noise ratio (SNR), and ADC quantization noise. As the results from these experiments demonstrate, uncorrelated phase noise dominates channel-to-channel phase uncertainty in multi-channel VSA´s which use independent LO´s for each downconverter. By contrast, SNR dominates channel-to-channel phase uncertainty in multi-channel VSA´s using a common synthesized LO for each channel. Moreover, the absolute channel-to-channel phase uncertainty is significantly better in the multi-channel VSA which uses a common LO for each downconverter chain.
Keywords :
analogue-digital conversion; oscillators; phase noise; pulse height analysers; quantisation (signal); ADC quantization noise; MIMO test setup; channel to channel phase variation; frequency 10 MHz; local oscillator; multichannel RF vector signal analyzer; phase coherency; signal to noise ratio; uncorrelated ADC sample clock phase noise; uncorrelated LO phase noise; Clocks; Instruments; MIMO; Phase noise; RF signals; Radio frequency; Signal analysis; Signal to noise ratio; Testing; Uncertainty; MIMO systems; noise measurement; oscillator noise; oscillator stability; oscillators; phase jitter; phase locked loops; phase locked oscillators; phase noise; phase synchronization; voltage control oscillators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest (MTT), 2010 IEEE MTT-S International
Conference_Location :
Anaheim, CA
ISSN :
0149-645X
Print_ISBN :
978-1-4244-6056-4
Electronic_ISBN :
0149-645X
Type :
conf
DOI :
10.1109/MWSYM.2010.5517354
Filename :
5517354
Link To Document :
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