Scanning Microwave Near-Field Microscope Based on the Multiport Technology

Author

Haddadi, Kamel ; Lasri, Tuami

Author_Institution

Inst. d´Electron., de Microelectron. et de Nanotechnol., Univ. Lille 1, Villeneuve-d´Ascq, France

Volume

62

Issue

12

fYear

2013

fDate

Dec. 2013

Firstpage

3189

Lastpage

3193

Abstract

A multiport based near field high frequency microscope is proposed for local nondestructive evaluation and testing applications. The combination of the multiport technology and near-field microscopy methods present advantages such as low cost, compactness, real-time operation, high spatial resolution and versatility. In particular, experimental demonstrations of a multiport near-field microscope is described in microwave frequency range. The spatial resolution of the instrument is experimentally verified to evaluate the performance of the technique proposed.

Keywords

acoustic microscopy; microwave measurement; nondestructive testing; compactness; high spatial resolution; local nondestructive evaluation; microwave frequency range; multiport near-field microscope; near-field microscopy methods; real-time operation; scanning microwave near-field microscope; testing applications; Microscopy; Microwave measurement; Microwave technology; Microwave theory and techniques; Nondestructive testing; Spatial resolution; Microwave sensing; multiport; near-field microwave microscopy; nondestructive testing; six-port;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/TIM.2013.2270918

Filename

6556992