DocumentCode
3138930
Title
High growth rate transparent conducting zinc-oxide thin film prepared by metalorganic chemical vapor deposition technique for device applications
Author
Wenas, Wilson W. ; Setiawan, A. ; Adriyanto, F. ; Sangian, H.
Author_Institution
Semicond. Res. Lab., Inst. of Technol. Bandung, Indonesia
fYear
1999
fDate
1999
Firstpage
322
Lastpage
324
Abstract
Transparent conducting zinc oxide films were grown by metalorganic chemical vapor deposition using diethylzinc/H2O and dimethylzinc/H2O reactant systems. The dimethylzinc/H2 O reactant system was introduced for the first time in this study to grow ZnO films. A very high growth rate of 10 μm/h was obtained. The B2H6 was also employed is an n-type dopant to lower the sheet resistivity of the films. By optimizing the B2H6 flow rate, the films with a sheet resistivity as low as 4 Ω/sq was achieved. The films showed a high transmittance of around 90% in a wavelength range from 400 nm to 1000 nm, suggesting their suitability to be used as transparent conducting materials
Keywords
II-VI semiconductors; MOCVD coatings; electrical resistivity; semiconductor growth; semiconductor thin films; zinc compounds; 400 to 1000 nm; ZnO; device applications; diethylzinc/H2O; dimethylzinc/H2O; high growth rate transparent conducting ZnO film; high transmittance; metalorganic chemical vapor deposition; sheet resistivity; transparent conducting materials; Chemical vapor deposition; Conducting materials; Conductive films; Conductivity; MOCVD; Plasma temperature; Semiconductor thin films; Substrates; Transistors; Zinc oxide;
fLanguage
English
Publisher
ieee
Conference_Titel
Optoelectronic and Microelectronic Materials Devices, 1998. Proceedings. 1998 Conference on
Conference_Location
Perth, WA
Print_ISBN
0-7803-4513-4
Type
conf
DOI
10.1109/COMMAD.1998.791652
Filename
791652
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