• DocumentCode
    3138930
  • Title

    High growth rate transparent conducting zinc-oxide thin film prepared by metalorganic chemical vapor deposition technique for device applications

  • Author

    Wenas, Wilson W. ; Setiawan, A. ; Adriyanto, F. ; Sangian, H.

  • Author_Institution
    Semicond. Res. Lab., Inst. of Technol. Bandung, Indonesia
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    322
  • Lastpage
    324
  • Abstract
    Transparent conducting zinc oxide films were grown by metalorganic chemical vapor deposition using diethylzinc/H2O and dimethylzinc/H2O reactant systems. The dimethylzinc/H2 O reactant system was introduced for the first time in this study to grow ZnO films. A very high growth rate of 10 μm/h was obtained. The B2H6 was also employed is an n-type dopant to lower the sheet resistivity of the films. By optimizing the B2H6 flow rate, the films with a sheet resistivity as low as 4 Ω/sq was achieved. The films showed a high transmittance of around 90% in a wavelength range from 400 nm to 1000 nm, suggesting their suitability to be used as transparent conducting materials
  • Keywords
    II-VI semiconductors; MOCVD coatings; electrical resistivity; semiconductor growth; semiconductor thin films; zinc compounds; 400 to 1000 nm; ZnO; device applications; diethylzinc/H2O; dimethylzinc/H2O; high growth rate transparent conducting ZnO film; high transmittance; metalorganic chemical vapor deposition; sheet resistivity; transparent conducting materials; Chemical vapor deposition; Conducting materials; Conductive films; Conductivity; MOCVD; Plasma temperature; Semiconductor thin films; Substrates; Transistors; Zinc oxide;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Optoelectronic and Microelectronic Materials Devices, 1998. Proceedings. 1998 Conference on
  • Conference_Location
    Perth, WA
  • Print_ISBN
    0-7803-4513-4
  • Type

    conf

  • DOI
    10.1109/COMMAD.1998.791652
  • Filename
    791652