Title :
Large-signal model for a resonant heterojunction tunnelling transistor RTD(n)-p-n
Author :
Wintrebert-Fouquet, M. ; Skellern, D.J.
Author_Institution :
Dept. of Electron., Macquarie Univ., North Ryde, NSW, Australia
Abstract :
A large-signal model is presented for a Resonant Tunnelling Bipolar Transistor (RTBT) with a double barrier structure at the Emitter. These devices show large collector current peak-to-valley ratios (PVR) in the common-emitter transistor configuration because of significant current gain reduction beyond resonance. This large PVR makes them attractive devices for circuit applications, including high speed analog-to-digital converters. The model combines the Current-Voltage relationship for a Heterojunction Bipolar Transistor (HBT) and the Current-Voltage relationship for a Resonant Tunnelling Diode (RTD). The thermionic emission effects along the structure, across the RTD´s barriers and across the HBT´s heterojunction are taken into account. The HBT model is based on the extended Gummel and Poon model of Parikh and Lindholm which takes into account the current flow across the emitter-base and the base-collector heterojunctions. The RTD is modelled in the coherent tunnelling regime and incorporates thermionic effect regime. Model results are presented for a 3 μm×3 μm device published in the literature-an InGaAs/AlAs on InP resonant tunnelling heterojunction bipolar transistors
Keywords :
III-V semiconductors; aluminium compounds; gallium arsenide; heterojunction bipolar transistors; indium compounds; resonant tunnelling transistors; semiconductor device models; InGaAs-AlAs-InP; InGaAs/AlAs on InP; Resonant Tunnelling Bipolar Transistor; base-collector heterojunctions; common-emitter transistor configuration; current flow; double barrier structure; emitter-base; extended Gummel and Poon model; high speed analog-to-digital converters; large collector current peak-to-valley ratios; large-signal model; resonant heterojunction tunnelling transistor; significant current gain reduction beyond resonance; thermionic effect regime; thermionic emission effects; Analog-digital conversion; Bipolar transistors; Circuits; Diodes; Heterojunction bipolar transistors; Indium gallium arsenide; Indium phosphide; Resonance; Resonant tunneling devices; Thermionic emission;
Conference_Titel :
Optoelectronic and Microelectronic Materials Devices, 1998. Proceedings. 1998 Conference on
Conference_Location :
Perth, WA
Print_ISBN :
0-7803-4513-4
DOI :
10.1109/COMMAD.1998.791653