DocumentCode :
3138998
Title :
Be-doped InGaAs/AlGaAs strained quantum well structures grown by molecular beam epitaxy
Author :
Zhang, D.H. ; Shi, W. ; Zhang, P.H. ; Yoon, S.F.
Author_Institution :
Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore
fYear :
1999
fDate :
1999
Firstpage :
337
Lastpage :
339
Abstract :
The effects of doping concentration incorporated into the well material of the p-type InGaAs/AlGaAs multiple quantum well structures are investigated by photoluminescence and double crystal X-ray diffraction techniques. The increased Be doping is found to cause red shift of the dopant-related and excitonic luminescence in the well material of the structures, increase well width, deteriorate the interface quality and increase lattice mismatch. Those factors affect the positioning of the heavy and light holes in the valence band well, and thus the infrared wavelength resulted from the intersubband transition. These observations are useful for the design of p-type quantum well infrared photodetectors
Keywords :
III-V semiconductors; X-ray diffraction; aluminium compounds; beryllium; gallium arsenide; indium compounds; infrared detectors; interface structure; molecular beam epitaxial growth; photodetectors; photoluminescence; red shift; semiconductor doping; semiconductor growth; semiconductor quantum wells; InGaAs-AlGaAs:Be; InGaAs/AlGaAs:Be strained quantum well structures; doping concentration; double crystal X-ray diffraction techniques; excitonic luminescence; infrared photodetectors; interface quality; intersubband transition; lattice mismatch; molecular beam epitaxy; photoluminescence; red shift; Crystalline materials; Doping; Indium gallium arsenide; Infrared detectors; Luminescence; Molecular beam epitaxial growth; Photodetectors; Photoluminescence; Quantum well devices; X-ray diffraction;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Optoelectronic and Microelectronic Materials Devices, 1998. Proceedings. 1998 Conference on
Conference_Location :
Perth, WA
Print_ISBN :
0-7803-4513-4
Type :
conf
DOI :
10.1109/COMMAD.1998.791656
Filename :
791656
Link To Document :
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