Source Reconstruction by Far-Field Data for Imaging of Defects in Frequency Selective Radomes

In this letter, an inverse source reconstruction method with great potential in radome diagnostics is presented. Defects, e.g., seams in large radomes, and lattice dislocations in frequency selective surface (FSS) radomes, are inevitable, and their electrical effects demand analysis. Here, defects in a frequency selective radome are analyzed with a method based on an integral formulation. Several far-field measurement series, illuminating different parts of the radome wall at 9.35 GHz, are employed to determine the equivalent surface currents and image the disturbances on the radome surface.