• DocumentCode
    3139086
  • Title

    Quantum well intermixing in InGaAs/(Al)GaAs by As and H irradiation

  • Author

    Fu, L. ; Tan, H.H. ; Jagadish, C. ; Johnston, M.B. ; Gal, M.

  • Author_Institution
    Dept. of Electron. Mater. Eng., Australian Nat. Univ., Canberra, ACT, Australia
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    355
  • Lastpage
    357
  • Abstract
    As and H irradiation with subsequent thermal annealing were used to investigate the intermixing of InGaAs/GaAs and InGaAs/AlGaAs quantum wells (QWs). Large photoluminescence (PL) energy shifts were observed in both materials, Due to dynamic annealing in AlGaAs and the presence of Al in the barriers, the InGaAs/AlGaAs samples showed better PL intensities recovery and larger energy shifts than the InGaAs/GaAs samples after both As and H irradiation. Larger energy shifts were obtained for As irradiation at lower doses than when compared to H irradiation, However, at higher doses H irradiation resulted in higher energy shift than As irradiation, Results of the effect of irradiation temperature showed that higher shift could be obtained with increasing temperature for As irradiation at lower doses while for H irradiation, implant temperature had little effect
  • Keywords
    III-V semiconductors; aluminium compounds; annealing; gallium arsenide; indium compounds; ion beam effects; photoluminescence; semiconductor quantum wells; surface diffusion; As; As irradiation; H; H irradiation; InAs-AlGaAs; InGaAs/(Al)GaAs; dynamic annealing; implant temperature; large photoluminescence energy shifts; quantum well intermixing; thermal annealing; Epitaxial growth; Gallium arsenide; Indium gallium arsenide; Ion implantation; Photoluminescence; Physics; Power engineering and energy; Rapid thermal annealing; Substrates; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Optoelectronic and Microelectronic Materials Devices, 1998. Proceedings. 1998 Conference on
  • Conference_Location
    Perth, WA
  • Print_ISBN
    0-7803-4513-4
  • Type

    conf

  • DOI
    10.1109/COMMAD.1998.791661
  • Filename
    791661