• DocumentCode
    3139326
  • Title

    Design automation methodology for improving the variability of synthesized digital circuits operating in the sub/near-threshold regime

  • Author

    Crop, Joseph ; Pawlowski, Robert ; Moezzi-Madani, Nariman ; Jackson, Jarrod ; Chaing, Patrick

  • Author_Institution
    Sch. of EECS, Oregon State Univ., Corvallis, OR, USA
  • fYear
    2011
  • fDate
    25-28 July 2011
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Ultra-low power digital circuit design using sub-threshold supply voltages has recently been popularized for energy-constrained systems, sensor networks and bio-sensor applications. The conventional method to improve digital circuit operation in the sub-threshold region is to design every logic cell manually, requiring complete re-design and re-characterization for every process node. This proposed work introduces a computational design automation that tests every cell in a standard cell library for proper operation in the sub-threshold region, eliminating cells that perform poorly. The result of this culling process is improved sub-/near-threshold operation for any standard cell library, improving delay, area, and energy. Monte-Carlo simulation results of a synthesized 90nm-CMOS Floating-Point Adder verifies improved mean timing delay (32%) and overall energy per computation (37%) of the culled standard cell library design over a regular synthesized design.
  • Keywords
    CMOS digital integrated circuits; Monte Carlo methods; adders; electronic design automation; integrated circuit design; logic circuits; low-power electronics; CMOS floating-point adder; Monte-Carlo simulation; biosensor applications; computational design automation; culling process; energy-constrained systems; logic cell; regular synthesized design; sensor networks; size 90 nm; standard cell library; sub-near-threshold regime; subthreshold supply voltages; synthesized digital circuit variability; ultra-low power digital circuit design; Computer architecture; Delay; Flip-flops; Leakage current; Libraries; Microprocessors; Design Automation; Sub-Threshold; Variation Reduction;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Green Computing Conference and Workshops (IGCC), 2011 International
  • Conference_Location
    Orlando, FL
  • Print_ISBN
    978-1-4577-1222-7
  • Type

    conf

  • DOI
    10.1109/IGCC.2011.6008604
  • Filename
    6008604