DocumentCode :
3139474
Title :
Robust design of deep Sub-micron CMOS wireless SoC
Author :
Hamada, Mototsugu ; Itoh, Nobuyuki
Author_Institution :
Toshiba Corp, Tokyo
fYear :
2008
fDate :
22-24 Jan. 2008
Firstpage :
61
Lastpage :
64
Abstract :
Scaled CMOS technology has opened the door of CMOS wireless SoC. The bright side is, apparently, high integration level and low cost implementation brought by the huge capacity of standard CMOS. However, as a designer point of view, another side should also be addressed, especially on PVT variation issues of scaled CMOS. In this paper, we will show the issues and their respective countermeasures on a voltage controlled oscillator in the local oscillator, a low noise amplifier and a channel select filter in the receiver, and digital calibration of I/Q mismatch in the transmitter.
Keywords :
CMOS logic circuits; channel bank filters; logic design; low noise amplifiers; radio receivers; radio transmitters; radiofrequency integrated circuits; system-on-chip; voltage-controlled oscillators; PVT variation; channel select filter; deep submicron CMOS wireless SoC design; digital calibration; local oscillator; low noise amplifier; voltage controlled oscillator; CMOS technology; Circuits; Filters; Local oscillators; Low-noise amplifiers; Phase noise; Robustness; Transceivers; Voltage; Voltage-controlled oscillators; RFCMOS; robust design; scaled CMOS; variation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radio and Wireless Symposium, 2008 IEEE
Conference_Location :
Orlando, FL
Print_ISBN :
978-1-4244-1462-8
Electronic_ISBN :
978-1-4244-1463-5
Type :
conf
DOI :
10.1109/RWS.2008.4463428
Filename :
4463428
Link To Document :
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