• DocumentCode
    31396
  • Title

    Measurement of Supercapacitor Fractional-Order Model Parameters From Voltage-Excited Step Response

  • Author

    Freeborn, Todd J. ; Maundy, Brent ; Elwakil, Ahmed S.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Calgary, Calgary, AB, Canada
  • Volume
    3
  • Issue
    3
  • fYear
    2013
  • fDate
    Sept. 2013
  • Firstpage
    367
  • Lastpage
    376
  • Abstract
    In this paper, we propose using a numerically solved least squares fitting process to estimate the impedance parameters of a fractional order model of supercapacitors from their voltage excited step response, without requiring direct measurement of the impedance or frequency response. Experimentally estimated parameters from low capacity supercapacitors of 0.33, 1, and 1.5 F in the time range 0.2-30 s and high capacity supercapacitors of 1500 and 3000 F in the time range 0.2-90 s verify the proposed time domain method showing less than 3% relative error between the simulated response (using the extracted fractional parameters) and the experimental step response in these time ranges. An application of employing supercapacitors in a multivibrator circuit is presented to highlight their fractional time-domain behavior.
  • Keywords
    least squares approximations; multivibrators; parameter estimation; step response; supercapacitors; time-domain analysis; capacitance 0.33 F; capacitance 1 F; capacitance 1.5 F; capacitance 1500 F; capacitance 3000 F; extracted fractional parameters; fractional time-domain behavior; high-capacity supercapacitors; impedance parameter estimation; low-capacity supercapacitors; multivibrator circuit; numerically-solved least squares fitting process; supercapacitor fractional-order model parameters; time 0.2 s to 90 s; voltage-excited step response; Impedance; Impedance measurement; Integrated circuit modeling; Mathematical model; Supercapacitors; Voltage measurement; Fractional calculus; impedance; measurement; supercapacitors; time-domain analysis;
  • fLanguage
    English
  • Journal_Title
    Emerging and Selected Topics in Circuits and Systems, IEEE Journal on
  • Publisher
    ieee
  • ISSN
    2156-3357
  • Type

    jour

  • DOI
    10.1109/JETCAS.2013.2271433
  • Filename
    6556993