Title :
18.2% (AM1.5) efficient GaAs solar cell on optical-grade polycrystalline Ge substrate
Author :
Venkatasubramanian, R. ; O´Quinn, B.C. ; Hills, J.S. ; Sharps, P.R. ; Timmons, M.L. ; Hutchby, J.A. ; Field, H. ; Ahrenkiel, R. ; Keyes, B.
Author_Institution :
Res. Triangle Inst., Research Triangle Park, NC, USA
Abstract :
In this work, the authors present GaAs material and device-structure optimization studies that have led to achieve a open-circuit voltage of ~1 volt and a best solar cell efficiency of 18.2% under AM1.5G illumination, for a 4 cm2 area GaAs cell on commercially-available, cast, optical-grade polycrystalline Ge substrate. This V∞ is almost 70 mV higher than on their previously-reported best GaAs cell on similar substrates. They discuss the growth of high-quality GaAs-AlGaAs layers, across the various crystalline orientations of a polycrystalline Ge substrate, important for obtaining good device performance. Optimization studies of the minority-carrier properties of GaAs layers on poly-Ge substrates have revealed that lifetime-spread across various grains can be reduced through the use of lower doping for the Al0.8Ga0.2As confinement layers. The cell-structure optimization procedures for improved V∞ and cell efficiency, include the use of thinner emitters, a spacer layer near the p+-n junction and an improved window layer. An experimental study of dark currents in these junctions, with and without the spacer, as a function of temperature (77 K to 288 K) is presented indicating that the spacer reduces the tunneling contribution to dark current
Keywords :
CVD coatings; III-V semiconductors; carrier lifetime; chemical vapour deposition; gallium arsenide; minority carriers; semiconductor device testing; semiconductor doping; solar cells; 1 V; 18.2 percent; 77 to 288 K; GaAs; GaAs solar cell; GaAs-AlGaAs; Ge; III-V semiconductor; MOCVD growth; crystalline orientations; dark currents; device performance; device-structure optimization; doping; emitters; lifetime-spread; minority-carrier properties; open-circuit voltage; optical-grade polycrystalline Ge substrate; p+-n junction; spacer layer; tunneling; window layer; Crystallization; Dark current; Doping; Gallium arsenide; Lighting; Optical devices; Optical materials; Photovoltaic cells; Temperature; Voltage;
Conference_Titel :
Photovoltaic Specialists Conference, 1996., Conference Record of the Twenty Fifth IEEE
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-3166-4
DOI :
10.1109/PVSC.1996.563940