Title :
Dielectric and Brillouin scattering anomalies in an Na12/Bi12/TiO3 (NBT) relaxor ferroelectric crystal
Author :
Schmidt, V.H. ; Tu, C.S. ; Siny, I.G.
Author_Institution :
Dept. of Phys., Montana State Univ., Bozeman, MT, USA
Abstract :
We investigated dielectric and hypersonic properties of NBT over a wide temperature range. The dielectric permittivity and loss measured from 20 Hz to 300 kHz agree at lower temperature with previous results. At higher temperature in and near the tetragonal phase the lower frequencies show a very large permittivity peak with considerable dispersion and large loss. This behavior is very similar to that found in other perovskite crystals and ceramics, in some cases far above Tc. We attribute it to extrinsic bulk conductivity. The phase shift giving nonzero σ" in σ=σ\´+jσ" may be caused by a spread in mobility activation energy. The Brillouin scattering data at 514.5 nm show a very broad dip in sound velocity and a very large and broad attenuation peak, both centered in the tetragonal phase temperature range. This behavior is attributed to hybridization of order parameter and cluster fluctuation contributions.
Keywords :
Brillouin spectra; carrier mobility; dielectric losses; electrical conductivity; ferroelectric materials; fluctuations; permittivity; ultrasonic propagation; ultrasonic velocity; 20 Hz to 300 kHz; 514.5 nm; Brillouin scattering anomalies; Na12/Bi12/TiO3; NaTiO3BiTiO3; attenuation peak; cluster fluctuation contributions; dielectric loss; dielectric permittivity; dielectric properties; dispersion; extrinsic bulk conductivity; hypersonic properties; mobility activation energy; order parameter hybridisation; perovskite crystals; phase shift; relaxor ferroelectric crystal; sound velocity; tetragonal phase; Brillouin scattering; Ceramics; Crystals; Dielectric loss measurement; Dielectric losses; Dielectric measurements; Frequency; Loss measurement; Permittivity measurement; Temperature distribution;
Conference_Titel :
Applications of Ferroelectrics, 1994.ISAF '94., Proceedings of the Ninth IEEE International Symposium on
Print_ISBN :
0-7803-1847-1
DOI :
10.1109/ISAF.1994.522294