DocumentCode
3140841
Title
An Algorithmic Pretest Development for Fault Identification in Analog Networks
Author
Masurka, V.
Author_Institution
Digital Equipment Corporation, Maynard, MA
fYear
1981
fDate
29-1 June 1981
Firstpage
204
Lastpage
212
Abstract
This paper describes the design and development of an algorithm for fault identification in electrical analog networks. The emphasis is on mathematical formulation of the problem and generation of a viable fault identification criterion. The method serves as a pretest for a catastrophic (or considerably out-of-tolerance) fault condition. Under non-accessibility of some of the nodes, the method estimates nodal voltages to arrive at an estimated admittance matrix for the faulty Unit Under Test (UUT). The simulation of networks is done through Electronic Circuit Analysis Program (ECAP).
Keywords
Admittance; Algorithm design and analysis; Analytical models; Circuit analysis; Circuit faults; Circuit simulation; Circuit testing; Electronic circuits; Fault diagnosis; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation, 1981. 18th Conference on
Type
conf
DOI
10.1109/DAC.1981.1585353
Filename
1585353
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