• DocumentCode
    3140841
  • Title

    An Algorithmic Pretest Development for Fault Identification in Analog Networks

  • Author

    Masurka, V.

  • Author_Institution
    Digital Equipment Corporation, Maynard, MA
  • fYear
    1981
  • fDate
    29-1 June 1981
  • Firstpage
    204
  • Lastpage
    212
  • Abstract
    This paper describes the design and development of an algorithm for fault identification in electrical analog networks. The emphasis is on mathematical formulation of the problem and generation of a viable fault identification criterion. The method serves as a pretest for a catastrophic (or considerably out-of-tolerance) fault condition. Under non-accessibility of some of the nodes, the method estimates nodal voltages to arrive at an estimated admittance matrix for the faulty Unit Under Test (UUT). The simulation of networks is done through Electronic Circuit Analysis Program (ECAP).
  • Keywords
    Admittance; Algorithm design and analysis; Analytical models; Circuit analysis; Circuit faults; Circuit simulation; Circuit testing; Electronic circuits; Fault diagnosis; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation, 1981. 18th Conference on
  • Type

    conf

  • DOI
    10.1109/DAC.1981.1585353
  • Filename
    1585353