• DocumentCode
    3140947
  • Title

    Diagnostic System for Large Scale Logic Cards and LSI´S

  • Author

    Goshima, Susumu ; Kozawa, Tokinori ; Oka, Yuichi ; Mori, Teruo ; Takeguch, Y. ; Ohno, Yasuhiero

  • Author_Institution
    Hitachi Research Laboratory Hitachi, Ltd., Ibaragi, Japan
  • fYear
    1981
  • fDate
    29-1 June 1981
  • Firstpage
    256
  • Lastpage
    259
  • Abstract
    We have developed the diagnostic system, consisting of highly automated test generator, fast fault simulator and automatic fault locator. Several techniques, employed in the system, are as follows: 9-value D-Algorithm for sequential circuits., 6-value concurrent fault simulator., Functional Modeling of RAM´S, ROM´S, counters, and etc., Iterative processing of generator and simulator. This system has contributed to testing cards, and LSI´S used in Hitachi computer M-200H and others.
  • Keywords
    Automatic testing; Circuit faults; Circuit simulation; Circuit testing; Computational modeling; Large scale integration; Large-scale systems; Logic; Sequential circuits; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation, 1981. 18th Conference on
  • Type

    conf

  • DOI
    10.1109/DAC.1981.1585360
  • Filename
    1585360
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3140947