• DocumentCode
    3140963
  • Title

    PODEM-X: An Automatic Test Generation System for VLSI Logic Structures

  • Author

    Goel, Prabhakar ; Rosales, Barry C.

  • Author_Institution
    nternational Business Machines Corporation, Poughkeepsie, NY
  • fYear
    1981
  • fDate
    29-1 June 1981
  • Firstpage
    260
  • Lastpage
    268
  • Abstract
    Multiple test generation algorithms and techniques described in this paper have been integrated into a unified system which has successfully produced tests for unpartitioned LSSD logic structures of up to 50,000 logic gates. The design concepts behind the creation of a unified system are presented, as are actual results obtained on large logic structures. System usability was significantly enhanced by the same concepts that facilitated the integration of multiple algorithms and techniques.
  • Keywords
    Automatic logic units; Automatic testing; Logic design; Logic gates; Logic testing; Random number generation; Shift registers; System testing; Test pattern generators; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation, 1981. 18th Conference on
  • Type

    conf

  • DOI
    10.1109/DAC.1981.1585361
  • Filename
    1585361
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3140963