• DocumentCode
    3141092
  • Title

    A computational approach to the analysis of distributed Bragg reflectors in direct-gap solar cells

  • Author

    Durbin, Steven M.

  • Author_Institution
    Dept. of Electr. Eng., Florida A&M Univ., Tallahassee, FL, USA
  • fYear
    1996
  • fDate
    13-17 May 1996
  • Firstpage
    69
  • Lastpage
    72
  • Abstract
    In this paper, the development of a detailed numerical model for analyzing direct-gap solar cells employing distributed Bragg reflectors is described. Energy-dependent reflection coefficients are computed for calculating trapping of external photons, and angular-dependent reflection is considered for trapping of photons emitted via radiative recombination. The resulting numerical model provides the ability to consider in detail the benefits and tradeoffs that arise from variations in the base thickness, base mobility and lifetime, and the distributed Bragg reflector structure itself. Example solar cell structures that may be modeled include AlGaAs/GaAs devices both on GaAs and on Si substrates, as well as novel types of GaSb-based thermophotovoltaic devices
  • Keywords
    III-V semiconductors; aluminium compounds; carrier lifetime; carrier mobility; electron-hole recombination; gallium arsenide; light reflection; semiconductor materials; solar cells; AlGaAs-GaAs; AlGaAs/GaAs devices; GaAs substrates; GaSb-based thermophotovoltaic devices; Si substrates; angular-dependent reflection; base mobility; base thickness; direct-gap solar cells; distributed Bragg reflectors; energy-dependent reflection coefficients; external photons trapping; lifetime; numerical model; radiative recombination; Absorption; Dielectric substrates; Distributed Bragg reflectors; Distributed computing; Optical reflection; Optical refraction; Photonic band gap; Photovoltaic cells; Radiative recombination; Spontaneous emission;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 1996., Conference Record of the Twenty Fifth IEEE
  • Conference_Location
    Washington, DC
  • ISSN
    0160-8371
  • Print_ISBN
    0-7803-3166-4
  • Type

    conf

  • DOI
    10.1109/PVSC.1996.563948
  • Filename
    563948