DocumentCode :
314121
Title :
PECVD silicon carbide for micromachined transducers
Author :
Flannery, Anthony F. ; Mourlas, Nicholas J. ; Storment, Christopher W. ; Tsai, Stan ; Tan, Samantha H. ; Kovacs, Gregory T A
Author_Institution :
Stanford Univ., CA, USA
Volume :
1
fYear :
1997
fDate :
16-19 Jun 1997
Firstpage :
217
Abstract :
We report preliminary work on PECVD amorphous hydrogenated silicon carbide (a-SiC:H) as a material with many potential applications in micromachined transducers. Four examples are presented: an electrochemical probe; a fully packaged, encapsulated pressure sensor; a sealed and coated microfluidic channel; and deep etched channels in glass. A designed experiment was undertaken in an attempt to correlate stress, resistivity and wet etchability with the following process parameters: pressure, CH4 flow rate, low frequency power, low frequency cycle time, high frequency power, and high frequency cycle time. While this preliminary work does demonstrate a CMOS compatible, insulating thin film with low stress (<100 MPa compressive), high etch resistance, and conformal coating, the complexity of the plasma chemistry will require further investigation to elaborate parameter dependencies
Keywords :
amorphous semiconductors; chemical sensors; conformal coatings; electrical resistivity; electrochemical analysis; encapsulation; etching; fluidic devices; hydrogen; internal stresses; micromachining; microsensors; plasma CVD; pressure sensors; semiconductor device packaging; semiconductor thin films; silicon compounds; CH4 flow rate; CMOS compatible insulating thin film; PECVD; SiC:H; a-SiC:H; coated microfluidic channel; conformal coating; deep etched channels; designed experiment; electrochemical probe; etch resistance; high frequency cycle time; high frequency power; low frequency cycle time; low frequency power; micromachined transducers; packaged encapsulated pressure sensor; plasma chemistry; resistivity; stress; wet etchability; Amorphous materials; Etching; Frequency; Glass; Microfluidics; Packaging; Probes; Silicon carbide; Stress; Transducers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid State Sensors and Actuators, 1997. TRANSDUCERS '97 Chicago., 1997 International Conference on
Conference_Location :
Chicago, IL
Print_ISBN :
0-7803-3829-4
Type :
conf
DOI :
10.1109/SENSOR.1997.613622
Filename :
613622
Link To Document :
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