DocumentCode :
3141303
Title :
Brainwave sub-band power ratio characteristics in intelligence assessment
Author :
Jahidin, A.H. ; Taib, M.N. ; Tahir, N. Md ; Ali, M. S A Megat ; Lias, S. ; Fuad, N. ; Omar, W.R.W.
Author_Institution :
Fac. of Electr. Eng., Univ. Teknol. MARA, Shah Alam, Malaysia
fYear :
2012
fDate :
16-17 July 2012
Firstpage :
318
Lastpage :
321
Abstract :
This paper discusses on the brainwave sub-band characteristics for different intelligence groups based on electroencephalogram (EEG) power ratio technique. The EEG datasets have been collected from 50 healthy subjects for two sessions; at relaxed, closed eye (CE) state as reference and at cognitively-stimulated state. In the stimulated state, subjects need to answer the intelligence quotient (IQ) test based on Raven´s Standard Progressive Matrices (RPM). Sub-band power ratio from the two sessions were calculated and further analyzed to observe the pattern among different IQ groups. The results show that by implementing power ratio technique, the pattern of IQ groups, especially in the relaxed state can be clearly observed. It can be concluded that the value for alpha ratio is higher for high IQ group compared to low IQ group. In contrast to beta and theta ratio where high IQ groups have lower value compared to the low IQ group. This indicates that the ESD ratios can discriminate the characteristic of brainwaves for intelligence assessment.
Keywords :
electroencephalography; eye; medical signal processing; signal sampling; EEG datasets; Raven standard progressive matrices; brainwave subband power ratio characteristics; closed eye state; cognitively-stimulated state; electroencephalogram power ratio technique; intelligence assessment; intelligence quotient testing; relaxed state; signal sampling; Control systems; Electroencephalography; Electrostatic discharges; Humans; Psychology; Standards; EEG; energy spectral density; human intelligence; intelligence quotient; power ratio;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Control and System Graduate Research Colloquium (ICSGRC), 2012 IEEE
Conference_Location :
Shah Alam, Selangor
Print_ISBN :
978-1-4673-2035-1
Type :
conf
DOI :
10.1109/ICSGRC.2012.6287184
Filename :
6287184
Link To Document :
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