Title :
ZnO nanostructures synthesized by arc discharge for optical coating and sensor applications
Author :
Fang, Fang ; Kennedy, Jessie ; Futter, John ; Leveneur, Jerome
Author_Institution :
Nat. Isotope Centre, GNS Sci., Lower Hutt, New Zealand
Abstract :
Zinc oxide (ZnO) is an important member of semiconductors with a wide direct band gap of 3.37 eV. ZnO nanostructures exhibit interesting properties including high catalytic efficiency and strong adsorption ability. The attention on ZnO nanostructures has been focused on the application in sensing because of its unique properties. The arc discharge method has been successfully applied to obtain ZnO nanostructures. Different arc discharge parameters were chosen to tune the morphology of the as-synthesized structures. Samples were characterized by using scanning electron microscopy (SEM), transmission electron microscopy (TEM) and near infrared diffuse reflectance spectroscopy. A large quantity of high purity ZnO nanorod structures were obtained. Different morphologies and size distributions of ZnO nanostructures were synthesized by changing partial pressure of arc discharge. Diffuse reflectance of the ZnO nanostructures synthesized by arc discharge method were successfully measured. Up to 60 % of near infrared reflection (NIR) was achieved for ZnO nanostructured synthesized by arc discharge method in the NIR range (800-950 nm). The developed ZnO nanostructures will be of immense use in optical coatings and sensors. This work highlights the potential use of ZnO nanostructures synthesized by the arc discharge method in optical and bio sensing industry.
Keywords :
II-VI semiconductors; antireflection coatings; arcs (electric); biosensors; infrared spectra; nanofabrication; nanorods; reflectivity; scanning electron microscopy; semiconductor growth; transmission electron microscopy; wide band gap semiconductors; zinc compounds; SEM; TEM; ZnO; ZnO nanostructures; arc discharge; diffuse reflectance; nanorod structures; near infrared diffuse reflectance spectroscopy; optical coating; scanning electron microscopy; sensor applications; size distributions; transmission electron microscopy; Arc discharges; Nanostructures; Optical reflection; Optical sensors; Reflectivity; Zinc oxide; arc discharge; nanostructures; near infrared reflectance; zinc oxide;
Conference_Titel :
Sensing Technology (ICST), 2013 Seventh International Conference on
Conference_Location :
Wellington
Print_ISBN :
978-1-4673-5220-8
DOI :
10.1109/ICSensT.2013.6727774