DocumentCode
3141472
Title
Imprint of ferroelectric PLZT thin-film capacitors with lanthanum strontium cobalt oxide electrodes
Author
Benedetto, J.M. ; Roush, M.L. ; Lloyd, I.K. ; Ramesh, R.
Author_Institution
Army Res. Lab., Adelphi, MD, USA
fYear
1991
fDate
33457
Firstpage
66
Lastpage
69
Abstract
The ferroelectric imprint is measured on thin-film PLZT capacitors with lanthanum strontium cobalt oxide top and bottom electrodes. The data show a significant amount of imprint with a combined elevated temperature and alternating (unipolar) voltage stress. No imprint was observed on samples that were temperature stressed without external bias
Keywords
ceramic capacitors; electrodes; ferroelectric capacitors; ferroelectric thin films; lanthanum compounds; lead compounds; piezoceramics; thin film capacitors; LaSrCoO; LaSrCoO electrodes; PLZT; PbLaZrO3TiO3; alternating voltage stress; elevated temperature; ferroelectric PLZT thin-film capacitors; ferroelectric imprint; temperature stressed; Capacitors; Cobalt; Electrodes; Ferroelectric materials; Lanthanum; Stress; Strontium; Temperature; Transistors; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Applications of Ferroelectrics, 1994.ISAF '94., Proceedings of the Ninth IEEE International Symposium on
Conference_Location
University Park, PA
Print_ISBN
0-7803-1847-1
Type
conf
DOI
10.1109/ISAF.1994.522299
Filename
522299
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