Title :
Imprint of ferroelectric PLZT thin-film capacitors with lanthanum strontium cobalt oxide electrodes
Author :
Benedetto, J.M. ; Roush, M.L. ; Lloyd, I.K. ; Ramesh, R.
Author_Institution :
Army Res. Lab., Adelphi, MD, USA
Abstract :
The ferroelectric imprint is measured on thin-film PLZT capacitors with lanthanum strontium cobalt oxide top and bottom electrodes. The data show a significant amount of imprint with a combined elevated temperature and alternating (unipolar) voltage stress. No imprint was observed on samples that were temperature stressed without external bias
Keywords :
ceramic capacitors; electrodes; ferroelectric capacitors; ferroelectric thin films; lanthanum compounds; lead compounds; piezoceramics; thin film capacitors; LaSrCoO; LaSrCoO electrodes; PLZT; PbLaZrO3TiO3; alternating voltage stress; elevated temperature; ferroelectric PLZT thin-film capacitors; ferroelectric imprint; temperature stressed; Capacitors; Cobalt; Electrodes; Ferroelectric materials; Lanthanum; Stress; Strontium; Temperature; Transistors; Voltage;
Conference_Titel :
Applications of Ferroelectrics, 1994.ISAF '94., Proceedings of the Ninth IEEE International Symposium on
Conference_Location :
University Park, PA
Print_ISBN :
0-7803-1847-1
DOI :
10.1109/ISAF.1994.522299
