Title :
Scaling torsional cantilevers for scanning probe microscope arrays: theory and experiment
Author :
Miller, Scott A. ; Turner, Kimberly L. ; MacDonald, Noel C.
Author_Institution :
Sch. of Appl. & Eng. Phys., Cornell Univ., Ithaca, NY, USA
Abstract :
An array (12×12) of microelectromechanical probe tips with integrated actuators and capacitive sensors for scanning probe microscopy has been designed, fabricated, and characterized. Each array element consists of a single crystal silicon tip on a torsional cantilever with out-of-plane interdigitated electrode capacitors. The size of each array element is about 150 μm by 150 μm with a tip-to-tip spacing in the array of 200 μm. Given these dimensions, the packing density of the devices is about 2500 units/cm2. The out-of-plane torsional design allows for significant improvement in performance (larger tip displacement and increased sense capacitance) and a higher density of devices per unit area as the minimum feature size (MFS) decreases
Keywords :
elemental semiconductors; microactuators; micromachining; scanning probe microscopy; silicon; 150 micron; 200 micron; Si; capacitive sensors; integrated actuators; microelectromechanical probe tips; minimum feature size; out-of-plane interdigitated electrode capacitors; out-of-plane torsional design; packing density; scanning probe microscope arrays; sense capacitance; tip displacement; tip-to-tip spacing; torsional cantilevers; Actuators; Electrodes; Instruments; Microscopy; Probes; Sensor arrays; Springs; Structural beams; Surface topography; Throughput;
Conference_Titel :
Solid State Sensors and Actuators, 1997. TRANSDUCERS '97 Chicago., 1997 International Conference on
Conference_Location :
Chicago, IL
Print_ISBN :
0-7803-3829-4
DOI :
10.1109/SENSOR.1997.613684