DocumentCode
3141838
Title
Document image quality: making fine discriminations
Author
Baird, Henry S.
Author_Institution
Xerox Palo Alto Res. Center, CA, USA
fYear
1999
fDate
20-22 Sep 1999
Firstpage
459
Lastpage
462
Abstract
We estimate, using synthetically generated images, the smallest changes in document image quality that can be distinguished reliably and fully automatically by T. Kanungo´s (1996) bootstrapping test. Six parameters of a physics based document image degradation model (H.S. Baird, 1992), are varied, one at time: for each, over a range of parameter value differences, two sets of synthetic images are generated pseudorandomly and the two sets tested for statistical equivalence using Kanungo´s method. The rate at which Kanungo´s method rejects the hypothesis that the two sets are drawn from the same distribution is analyzed as a function of parameter difference (a specialized “power function”). The finest discriminations afforded by the method are given by the width of the power function at a low fixed reject threshold. The data show that remarkably fine discriminations are possible-often subtler than are evident to visual inspection-for all six parameters. As few as 25 reference images are sufficient. These results suggest that Kanungo´s method is sufficiently sensitive to a wide range of physics based image degradations to serve as an engineering foundation for many image quality estimation and OCR engineering purposes
Keywords
document image processing; image processing; quality control; statistical analysis; OCR engineering; bootstrapping test; document image quality; fine discriminations; image quality estimation; low fixed reject threshold; parameter difference; parameter value differences; physics based document image degradation model; physics based image degradations; reference images; specialized power function; statistical equivalence; synthetic images; synthetically generated images; Automatic testing; Degradation; Electrical capacitance tomography; Image generation; Image quality; Image recognition; Parameter estimation; Physics; Postal services; Read only memory;
fLanguage
English
Publisher
ieee
Conference_Titel
Document Analysis and Recognition, 1999. ICDAR '99. Proceedings of the Fifth International Conference on
Conference_Location
Bangalore
Print_ISBN
0-7695-0318-7
Type
conf
DOI
10.1109/ICDAR.1999.791824
Filename
791824
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