• DocumentCode
    3141858
  • Title

    A Noise Insensitive Cluster Validity Measure for Pattern Classification

  • Author

    Chen, Gang ; Guo, Xiao-Yong ; Hu, Tai

  • Author_Institution
    Lab. of Simulation of Space Inf., Chinese Acad. of Sci., Beijing, China
  • fYear
    2009
  • fDate
    1-3 June 2009
  • Firstpage
    574
  • Lastpage
    578
  • Abstract
    When trying to discover knowledge on a collection of data, one of the first arising tasks is to identify groups of similar objects, that is, to carry out cluster analysis for obtaining data partitions. Thus, a decision must be taken for choosing the clustering result that produces the best data partition for a given data collection. In order to support such a decision, indexes for measuring the quality of a data partitioning must be constructed. So far, several cluster validity indexes have been formulated in the literatures. Each of those indexes has strengths and drawbacks when compared with the others. In the present study, an alternative cluster validity index is formulated. The proposed validity index not only takes the contribution of each pattern into consideration, but also relies on information of intra-cluster and inter-cluster distance. The main advantage of the presented index is that is insensitive to noise by introducing the Gaussian kernel into the proposed validity index. An experimental design was devised in order to determine the comparative performance of the proposed cluster validity index against DB index previously formulated in the literature. Experimental results show that the proposed index is insensitive to noise and adaptive to produce good clustering solution.
  • Keywords
    Gaussian processes; data mining; pattern classification; Gaussian kernel; cluster validity index; knowledge discovery; noise insensitive cluster validity measure; pattern classification; Analytical models; Clustering methods; Computational modeling; Computer simulation; Extraterrestrial measurements; Information science; Noise measurement; Pattern analysis; Pattern classification; Scattering; Classification; Cluster analysis; Cluster validity indices; DB index; K-means;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer and Information Science, 2009. ICIS 2009. Eighth IEEE/ACIS International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    978-0-7695-3641-5
  • Type

    conf

  • DOI
    10.1109/ICIS.2009.141
  • Filename
    5223008