DocumentCode
314186
Title
Fabrication and characterization of U-shaped beams for the determination of Young´s modulus modification due to Joule heating of polysilicon microstructures
Author
Yang, E.H. ; Fujita, H.
Author_Institution
Inst. of Ind. Sci., Tokyo Univ., Japan
Volume
1
fYear
1997
fDate
16-19 Jun 1997
Firstpage
603
Abstract
The modification of Young´s modulus is determined before and after the Joule heating generated by a current passing through polysilicon microstructures. U-shaped overhanging polysilicon beams are specially designed and fabricated to prevent both the heat transfer to substrate and the deformation by thermal expansion. The Joule heating is performed to the beams by applying a current of 5-20 mA for 5-10 seconds. The measured resonant frequencies shift up or down after the Joule heating, which is due to the deflection change of beams. The modification of the Young´s modulus is very small, which means that material properties after the reshaping are not changed much
Keywords
Young´s modulus; elastic moduli measurement; elemental semiconductors; micromechanical resonators; resistance heating; semiconductor technology; silicon; thermomechanical treatment; 5 to 10 s; 5 to 20 mA; Joule heating; Si; U-shaped beams; U-shaped overhanging polysilicon beams; Young´s modulus modification; applied current; deflection change; polysilicon beam fabrication; polysilicon microstructures; reshaping technology; resonant frequency shift; Annealing; Fabrication; Frequency measurement; Heat transfer; Heating; Microstructure; Plastics; Resonant frequency; Structural beams; Thermal expansion;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid State Sensors and Actuators, 1997. TRANSDUCERS '97 Chicago., 1997 International Conference on
Conference_Location
Chicago, IL
Print_ISBN
0-7803-3829-4
Type
conf
DOI
10.1109/SENSOR.1997.613723
Filename
613723
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