• DocumentCode
    314186
  • Title

    Fabrication and characterization of U-shaped beams for the determination of Young´s modulus modification due to Joule heating of polysilicon microstructures

  • Author

    Yang, E.H. ; Fujita, H.

  • Author_Institution
    Inst. of Ind. Sci., Tokyo Univ., Japan
  • Volume
    1
  • fYear
    1997
  • fDate
    16-19 Jun 1997
  • Firstpage
    603
  • Abstract
    The modification of Young´s modulus is determined before and after the Joule heating generated by a current passing through polysilicon microstructures. U-shaped overhanging polysilicon beams are specially designed and fabricated to prevent both the heat transfer to substrate and the deformation by thermal expansion. The Joule heating is performed to the beams by applying a current of 5-20 mA for 5-10 seconds. The measured resonant frequencies shift up or down after the Joule heating, which is due to the deflection change of beams. The modification of the Young´s modulus is very small, which means that material properties after the reshaping are not changed much
  • Keywords
    Young´s modulus; elastic moduli measurement; elemental semiconductors; micromechanical resonators; resistance heating; semiconductor technology; silicon; thermomechanical treatment; 5 to 10 s; 5 to 20 mA; Joule heating; Si; U-shaped beams; U-shaped overhanging polysilicon beams; Young´s modulus modification; applied current; deflection change; polysilicon beam fabrication; polysilicon microstructures; reshaping technology; resonant frequency shift; Annealing; Fabrication; Frequency measurement; Heat transfer; Heating; Microstructure; Plastics; Resonant frequency; Structural beams; Thermal expansion;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid State Sensors and Actuators, 1997. TRANSDUCERS '97 Chicago., 1997 International Conference on
  • Conference_Location
    Chicago, IL
  • Print_ISBN
    0-7803-3829-4
  • Type

    conf

  • DOI
    10.1109/SENSOR.1997.613723
  • Filename
    613723