Abstract :
The following topics were dealt with: systems-on-chips; network-on-chips; fault modelling; fault analysis; fault simulation; fault diagnosis; design; verification; validation; synthesis; automatic test generation; analog signal testing; mixed signal testing; DFT; BIST; single-event upset modelling; embedded software test; protocol; Web services; radiation effects; fault tolerant architectures; fault tolerant techniques; process control; process measurements.
Keywords :
Web services; analogue integrated circuits; automatic test pattern generation; built-in self test; design for testability; fault diagnosis; fault tolerance; integrated circuit design; integrated circuit testing; mixed analogue-digital integrated circuits; network-on-chip; process control; protocols; radiation effects; system-on-chip; BIST; DFT; Web services; analog signal testing; automatic test generation; design; embedded software test; fault analysis; fault diagnosis; fault modelling; fault simulation; fault tolerant architectures; fault tolerant techniques; mixed signal testing; network-on-chips; process control; process measurements; protocol; radiation effects; single-event upset modelling; synthesis; systems-on-chips; validation; verification;
Conference_Titel :
Test Workshop, 2009. LATW '09. 10th Latin American
Conference_Location :
Buzios, Rio de Janeiro
Print_ISBN :
978-1-4244-4207-2
DOI :
10.1109/LATW.2009.4813781
