Magnetic force microscopy measurements of skew angle dependencies in perpendicular media

Author

Svedberg, E.B. ; Litvinov, D. ; Gustafson, R. ; Chang, C.H. ; Khizroev, S.

Author_Institution

Seagate Res., Pittsburgh, PA, USA

fYear

2003

fDate

6-8 Jan. 2003

Firstpage

38

Abstract

Today, one of the most critical issues in implementing perpendicular recording is believed to be the excessive sensitivity of a typical perpendicular recording system to the skew angle. In perpendicular data storage, the recording is expected to be produced in the effective gap near the trailing edge of the main pole of a single pole head (SPH). In this paper, magnetic force microscopy (MFM) is utilized to study the skew angle effects in perpendicular media with a CoCr-based hard layer and a Permalloy soft underlayer.

Keywords

Permalloy; magnetic force microscopy; magnetic heads; magnetic multilayers; perpendicular magnetic recording; soft magnetic materials; CoCr-based hard layers; FeNi; MFM; Permalloy soft underlayers; SPH trailing edge effective gap; magnetic force microscopy; magnetic recording heads; perpendicular media skew angle dependencies; perpendicular recording systems; single pole head main pole trailing edge; skew angle effects; Degradation; Force measurement; Goniometers; Linear approximation; Magnetic force microscopy; Magnetic forces; Magnetic heads; Magnetic recording; Memory; Perpendicular magnetic recording;

fLanguage

English

Publisher

ieee

Conference_Titel

Joint NAPMRC 2003. Digest of Technical Papers [Perpendicular Magnetic Recording Conference]

Conference_Location

Monterey, CA, USA

Print_ISBN

0-7803-7746-X

Type

conf

DOI

10.1109/NAPMRC.2003.1177042

Filename

1177042