High-Level Decision Diagrams based coverage metrics for verification and test

The paper proposes high-level decision diagrams (HLDDs) model based structural coverage metrics that are applicable to both verification and high-level test. Previous works have shown that HLDDs are an efficient model for simulation and test generation. However, the coverage properties of HLDDs against hardware description languages (HDL) have not been studied in detail before. In this paper we show that the proposed methodology allows more stringent structural coverage analysis than traditional VHDL code coverage. Furthermore, the main new contribution of the paper is a hierarchical approach for condition coverage metric analysis that is based on HLDDs with expansion graphs for conditional nodes. Experiments on ITC99 benchmarks show that up to 14% increase in coverage accuracy can be achieved by the proposed methodology.