DocumentCode
3142366
Title
Substrate Integrated Circuits (SICs) for low-cost high-density integration of millimeter-wave wireless systems
Author
Wu, Ke
Author_Institution
Ecole Polytech. Pavilion Lassonde, Montreal
fYear
2008
fDate
22-24 Jan. 2008
Firstpage
683
Lastpage
686
Abstract
The attractiveness and popularity of substrate integrated circuits (SICs) now become more and more apparent in our microwave and millimeter-wave community with numerous academic publications and industrial developments. This paper reviews the progress and the state-of- the-art of SICs-related research for developing low-cost high- density integration of microwave and millimeter-wave wireless devices and systems as well as microwave photonic applications. It is found that SICs may well be regarded as the next generation of high-frequency integrated circuits on the basis of their historical development path starting from the hollow rectangular waveguide. Challenging issues and future directions are discussed for research and developments, suggesting that SICs would be able to offer a potentially cost- effective and performance-promising solution for mass commercial applications.
Keywords
integrated circuit design; microwave integrated circuits; millimetre wave integrated circuits; high-frequency integrated circuits; hollow rectangular waveguide; low-cost high-density integration; microwave photonic applications; microwave wireless devices; millimeter-wave wireless systems; substrate integrated circuits; Coaxial components; Dielectric substrates; Fabrication; Microwave devices; Microwave generation; Microwave integrated circuits; Millimeter wave integrated circuits; Planar waveguides; Silicon carbide; Submillimeter wave integrated circuits; Substrate integrated circuits (SICs); hybrid integration; millimeter-waves; substrate integrated image guide (SIIG); substrate integrated non-radiative dielectric (SIND) guide; substrate integrated waveguide (SIW);
fLanguage
English
Publisher
ieee
Conference_Titel
Radio and Wireless Symposium, 2008 IEEE
Conference_Location
Orlando, FL
Print_ISBN
978-1-4244-1462-8
Electronic_ISBN
978-1-4244-1463-5
Type
conf
DOI
10.1109/RWS.2008.4463584
Filename
4463584
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