Title :
A modern look at the CMOS stuck-open fault
Author :
Gomez, Roberto ; Champac, Victor ; Hawkins, Chuck ; Segura, Jaume
Author_Institution :
Dept. Electron. Eng., Nat. Inst. for Astrophys., Puebla
Abstract :
The stuck-open fault (SOF) is a difficult, hard failure mechanism unique to CMOS technology [1-3]. Its detection requires a specific 2-vector pair that examines each transistor in the logic gate for an open defect in its drain and/or source. This defect defies a guaranteed 100% detection. We will show that this mostly discarded failure mechanism is very relevant to modern ICs. Current leakage in nanoscale technologies influence significantly the behavior of this fault.
Keywords :
CMOS logic circuits; failure analysis; fault diagnosis; logic gates; CMOS technology; current leakage; failure mechanism; logic gate; stuck-open fault; CMOS logic circuits; CMOS technology; Capacitance; Circuit faults; Circuit testing; Combinational circuits; Failure analysis; Integrated circuit noise; Leak detection; Logic gates;
Conference_Titel :
Test Workshop, 2009. LATW '09. 10th Latin American
Conference_Location :
Buzios, Rio de Janeiro
Print_ISBN :
978-1-4244-4207-2
Electronic_ISBN :
978-1-4244-4206-5
DOI :
10.1109/LATW.2009.4813818
