Title :
High power RF switch MMICs development in GaN-on-Si HFET technology
Author :
Yu, Mark ; Ward, Robert J. ; Hegazi, Gamal M.
Author_Institution :
Rockwell Collins Inc., Cedar Rapids
Abstract :
The development of a high power RF SP4T MMIC switch using AlGaN/GaN HFETs on Si substrate is reported for applications up to 2 GHz. The off-state capacitance(Coff) of a single-gate GaN based HFET is 250 fF and the on-state resistance (Ron) is 4.1 Omega at a gate length of 0.7 mum and a width of 1 mm. The MMIC SP4T switch with a size of 1.2 x 1.6 mm2 is implemented for system applications of three transmit paths and a receiver, of which each was configured with a series-shunt self-biased configuration. The switch has achieved an insertion loss of -0.95 dB with power handling of P(-0.1dB)=45 dBm at 1 GHz at the transmitter paths and an optimized isolation of better than 28 dB at the receiver path of up to 2.5 GHz. In addition, a high voltage switch driver using the GaN power HFET technology was designed with an input control voltage of 0/2.3 V to provide an output voltage of 0/28 V. This development provides a baseline design for our first generation MMIC switches in GaN technology.
Keywords :
III-V semiconductors; capacitance; electric resistance; elemental semiconductors; field effect MMIC; field effect transistor switches; gallium compounds; integrated circuit design; power HEMT; power semiconductor switches; semiconductor heterojunctions; silicon; wide band gap semiconductors; GaN-Si; bandwidth 1 GHz; bandwidth 2 GHz; bandwidth 2.5 GHz; baseline design; capacitance 250 fF; heterostructure field effect transistors; high power RF SP4T MMIC switch; high voltage switch driver; input control voltage; loss 0.95 dB; off-state capacitance; on-state resistance; output voltage; receiver paths; resistance 4.1 ohm; series-shunt self-biased configuration; single-gate HFET; size 0.7 mum; size 1 mm; size 1.2 mm; size 1.6 mm; transmitter paths; Aluminum gallium nitride; Capacitance; Gallium nitride; HEMTs; Insertion loss; MMICs; MODFETs; Propagation losses; Radio frequency; Switches; GaN HFET; MMIC switches; SP4T; high power switches;
Conference_Titel :
Radio and Wireless Symposium, 2008 IEEE
Conference_Location :
Orlando, FL
Print_ISBN :
978-1-4244-1462-8
Electronic_ISBN :
978-1-4244-1463-5
DOI :
10.1109/RWS.2008.4463627