Abstract :
The IEEE International Integrated Reliability Workshop (IRW) originated from the Wafer Level Reliability Workshop in 1982. The IRW focuses on ensuring electronic device reliability through fabrication, design, testing, characterization, and simulation, as well as identification of the defects and physical mechanisms responsible for reliability problems. Through tutorials, paper presentations, discussion groups, special interest groups, and the informal format of the technical program, a unique environment is provided for understanding, developing, and sharing reliability technology and test methodology for present and future semiconductor applications as well as ample opportunity for discussions and interactions with colleagues.
