Title :
Testing Functional Faults in VLSI
Author :
Min, Yinghua ; Su, Stephen Y H
Author_Institution :
China Academy of Railway Sciences, Beijing, China
Abstract :
Functional testing has become increasingly important due to the advent of VLSI technology. This paper presents a systematic procedure for generating tests for detecting functional faults in digital systems described by the register transfer language. Procedures for testing register decoding, instruction decoding, data transfer, data storage and data manipulation function faults in microprocessors are described step-by-step. Examples are given to illustrate the procedures.
Keywords :
Circuit faults; Circuit testing; Computer science; Decoding; Digital systems; Fault detection; Microprocessors; Registers; System testing; Very large scale integration;
Conference_Titel :
Design Automation, 1982. 19th Conference on
Conference_Location :
Las Vegas, NV, USA
Print_ISBN :
0-89791-020-6
DOI :
10.1109/DAC.1982.1585528
