• DocumentCode
    3144608
  • Title

    An Interactive Testability Analysis Program - ITTAP

  • Author

    Goel, D.K. ; McDermott, R.M.

  • Author_Institution
    ITT LSI Center, Milford, CT
  • fYear
    1982
  • fDate
    14-16 June 1982
  • Firstpage
    581
  • Lastpage
    586
  • Abstract
    ITTAP is a testability analysis program developed at the ITT-LSI technology center. In this paper we describe a testability measure for the test length and discuss the use of the selective trace concept for testability calculations. It is shown that ITTAP provides an order of magnitude improvement in run time over existing programs like SCOAP.
  • Keywords
    Area measurement; Automatic control; Circuit testing; Controllability; Current measurement; Design for testability; Laboratories; Large scale integration; Length measurement; Logic;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation, 1982. 19th Conference on
  • Conference_Location
    Las Vegas, NV, USA
  • ISSN
    0146-7123
  • Print_ISBN
    0-89791-020-6
  • Type

    conf

  • DOI
    10.1109/DAC.1982.1585556
  • Filename
    1585556
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3144608