Title :
Logic Simulation for LSI
Author :
Hirakawa, Kazuyuki ; Shiraki, Noboru ; Muraoka, Michiaki
Author_Institution :
OKI Electric Industry Co., Ltd., Tokyo, Japan
Abstract :
This paper describes the logic simulation system and the design verification method for logic design, timing analysis, and testing for VLSI. The integrity of test and network data on a logic design stage must be kept in LSI testing in the final verification stage. In dealing with consistency, emphasis is placed on the discrepancy between the real time domain on a simulator and a testing time domain on an LSI tester. The logic simulation system (Block INtegrator and AnaLYzer: BINALY) handles a hierarchical structure, a detailed timing model, and a timing alignment method for a testing time domain.
Keywords :
Analytical models; Circuit simulation; Circuit testing; Large scale integration; Logic design; Logic devices; Logic testing; System testing; Timing; Very large scale integration;
Conference_Titel :
Design Automation, 1982. 19th Conference on
Conference_Location :
Las Vegas, NV, USA
Print_ISBN :
0-89791-020-6
DOI :
10.1109/DAC.1982.1585580