Title :
A 12-bit 100-MS/s pipelined ADC in 45-nm CMOS
Author :
Nam, Jae-Won ; Jeon, Young-Deuk ; Yun, Seok-Ju ; Roh, Tae Moon ; Kwon, Jong-Kee
Author_Institution :
Sensor Interface Res. Team, ETRI, Daejeon, South Korea
Abstract :
This paper presents a 12-bit 100-MS/s pipeline analog-to-digital converter (ADC) in a 45-nm CMOS technology. The low-voltage circuit techniques and a careful layout are adopted to obtain high-resolution in a low-supply. The ADC features 12-bit resolution, 100-MS/s sampling rate, differential nonlinearity (DNL) of ±0.58 LSB, integral nonlinearity (INL) of ±2.79 LSB, and power consumption of 30.4 mW. With a sampling frequency of a 100-MS/s and an input of a 2.4 MHz, the ADC achieves a signal to noise-and-distortion ratio and a spurious-free dynamic range of 59.02 dB and 63.22 dB, at a supply voltage of 1.1 V, respectively.
Keywords :
CMOS integrated circuits; analogue-digital conversion; CMOS technology; analog-to-digital converter; differential nonlinearity; frequency 2.4 MHz; integral nonlinearity; low-voltage circuit technique; pipelined ADC; power 30.4 mW; power consumption; size 45 nm; voltage 1.1 V; word length 12 bit; ADC; CMOS; Pipelined;
Conference_Titel :
SoC Design Conference (ISOCC), 2011 International
Conference_Location :
Jeju
Print_ISBN :
978-1-4577-0709-4
Electronic_ISBN :
978-1-4577-0710-0
DOI :
10.1109/ISOCC.2011.6138617