• DocumentCode
    3145136
  • Title

    An on-chip hot pixel identification and correction approach in CMOS imagers

  • Author

    Cao, Yuan ; Zhang, Xiangyu

  • Author_Institution
    EEE Dept., Nanyang Technol. Univ., Singapore, Singapore
  • fYear
    2011
  • fDate
    17-18 Nov. 2011
  • Firstpage
    408
  • Lastpage
    411
  • Abstract
    The appearance of hot pixels significantly degrades the image qualities over the image sensor lifetime. In this paper, a robust readout circuitry is proposed to on-chip detect and mask the hot pixels in image sensors. Conventionally, hot pixels modeled as salt and pepper noise are corrected by an low pass filter which is applied to the entire image. However, this results the loss of overall image sharpness. The proposed approach provides the exact hot pixel positions before correction. It does not require extra non-volatile memory to store the map of the hot pixels. In addition, this method allows identification of new hot pixels generated during the sensor lifetime.
  • Keywords
    CMOS image sensors; image denoising; low-pass filters; readout electronics; reliability; system-on-chip; CMOS imagers; image quality; image sensor lifetime; image sharpness; low pass filter; on-chip hot pixel correction; on-chip hot pixel identification; robust readout circuitry; salt and pepper noise;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    SoC Design Conference (ISOCC), 2011 International
  • Conference_Location
    Jeju
  • Print_ISBN
    978-1-4577-0709-4
  • Electronic_ISBN
    978-1-4577-0710-0
  • Type

    conf

  • DOI
    10.1109/ISOCC.2011.6138618
  • Filename
    6138618