• DocumentCode
    3145345
  • Title

    Electronically tunable diplexer for frequency-agile transceiver front-end

  • Author

    Djoumessi, Erick E. ; Wu, Ke

  • Author_Institution
    Poly-Grames Res. Center, Ecole Polytech., Montreal, QC, Canada
  • fYear
    2010
  • fDate
    23-28 May 2010
  • Firstpage
    1472
  • Lastpage
    1475
  • Abstract
    A varactor-based tunable diplexer is proposed and experimentally validated for IEEE802.16 standard-based system applications. The proposed transmit/receive (Tx/Rx) diplexer consists of two tunable dual-mode bandpass filters. Size reduction and band tunability are achieved by using the capacitance of varactors diodes. With two-tone nonlinear characterization test, the diplexer (with higher biased voltage) is found to introduce, in Tx frequency band, a high level of intermodulation product (IIP3). A better insertion loss in passbands is observed for a lower room temperature. Measured insertion loss of our fabricated diplexer is obtained between 5.3 to 2.89 dB and 5.2 to 3.7 dB over the tuning frequency range for the Tx and Rx channels filters bands, respectively. Both filters exhibit better than 40 dB rejection in the passband of its counterpart. The varactors diodes attached to both filters allow 24.5% and 23.3% center-frequency tunability in Tx and Rx filters bands, respectively.
  • Keywords
    band-pass filters; frequency agility; multiplexing equipment; transceivers; electronically tunable diplexer; frequency-agile transceiver front-end; tunable dual-mode bandpass filters; varactor-based tunable diplexer; Band pass filters; Capacitance; Diodes; Frequency; Insertion loss; Passband; Testing; Transceivers; Varactors; Voltage; IEEE801.16 standard; Tunable diplexer; cognitive radio; dual-mode bandpass filter; non-linearity; software-defined system; tunable transceiver; varactor diode;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest (MTT), 2010 IEEE MTT-S International
  • Conference_Location
    Anaheim, CA
  • ISSN
    0149-645X
  • Print_ISBN
    978-1-4244-6056-4
  • Electronic_ISBN
    0149-645X
  • Type

    conf

  • DOI
    10.1109/MWSYM.2010.5517700
  • Filename
    5517700