DocumentCode :
3145427
Title :
Microwave-induced electromigration in multicomponent metallic alloys
Author :
Vaucher, Séebastien ; Bernau, Laurent ; Stir, Manuela ; Ishizaki, Kotaro ; Catala-Civera, Josée-Manuel ; Nicula, Radu
Author_Institution :
Lab. for Adv. Mater. Process., Empa - Swiss Fed. Labs. for Mater. Testing & Res., Thun, Switzerland
fYear :
2010
fDate :
23-28 May 2010
Firstpage :
1440
Lastpage :
1443
Abstract :
The crystallization of amorphous FeCoCuZrAlSiB alloy ribbons during microwave heating was investigated in situ using time-resolved X-ray powder diffraction. The formation of the nanocrystalline α-(Fe,Co)(SiAl) phase during the primary crystallization stage is followed by the crystallization of the residual glassy matrix. Scanning electron microscopy analysis after microwave exposure reveals the formation of nanosized hillocks evenly distributed over the ribbon surfaces. Local chemical composition analysis by energy-dispersive spectroscopy shows that the surface clusters are enriched in Cu and Al. The occurrence of this typical electromigration effect imposes a strong restriction on the duration of the exposure of metallic ribbons to microwave fields and reinforces the need for prior characterization in particular by in situ time-resolved techniques.
Keywords :
aluminium alloys; boron alloys; cobalt alloys; copper alloys; crystallisation; electromagnetic fields; electromigration; iron alloys; microwave heating; scanning electron microscopy; silicon alloys; zirconium alloys; FeCoCuZrAlSiB; amorphous alloy ribbon crystallization; chemical composition analysis; energy dispersive spectroscopy; glassy matrix; metallic ribbons; microwave fields; microwave heating; microwave induced electromigration; multicomponent metallic alloys; nanocrystalline formation; nanosized hillocks; primary crystallization stage; ribbon surface; scanning electron microscopy analysis; surface clusters; time resolved X-ray powder diffraction; Amorphous materials; Chemical analysis; Crystallization; Electromagnetic heating; Electromigration; Microwave theory and techniques; Powders; Scanning electron microscopy; Spectroscopy; X-ray diffraction; Amorphous magnetic materials; X-ray diffraction; diffusion; electromagnetic heating; electromigration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest (MTT), 2010 IEEE MTT-S International
Conference_Location :
Anaheim, CA
ISSN :
0149-645X
Print_ISBN :
978-1-4244-6056-4
Electronic_ISBN :
0149-645X
Type :
conf
DOI :
10.1109/MWSYM.2010.5517705
Filename :
5517705
Link To Document :
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