Title :
A robust eyelid and eyelash removal method and a local binarization based feature extraction technique for iris recognition system
Author :
Mirza, Duratulain ; Taj, Imtiaz A. ; Khalid, Ayesha
Abstract :
Biometric systems are becoming popular in replacing conventional security systems. Out of several, iris recognition systems are proving to be highly successful due to their high accuracy and low error rate. This paper presents a new and simple method of extracting features from the iris pattern hence avoiding most of the heavy computations and complexity observed in existing algorithms. In addition to this, robust techniques for eyelid and eyelash detection have been proposed. The proposed detection and encoding scheme gives satisfactory results when tested on several existing databases and outperforms existing techniques when compared to them.
Keywords :
feature extraction; iris recognition; biometric system; eyelash removal method; iris pattern; iris recognition system; local binarization based feature extraction; robust eyelid removal method; Biometrics; Encoding; Error analysis; Eyelashes; Eyelids; Feature extraction; Iris recognition; Robustness; Security; Testing;
Conference_Titel :
Multitopic Conference, 2009. INMIC 2009. IEEE 13th International
Conference_Location :
Islamabad
Print_ISBN :
978-1-4244-4872-2
Electronic_ISBN :
978-1-4244-4873-9
DOI :
10.1109/INMIC.2009.5383109