• DocumentCode
    3145551
  • Title

    A 21 V output charge pump circuit with appropriate well-bias supply technique in 0.18 μm Si CMOS

  • Author

    Shirane, Atsushi ; Ito, Hiroyuki ; Ishihara, Noboru ; Masu, Kazuya

  • Author_Institution
    Solutions Res. Lab. (SSRL), Tokyo Inst. of Technol., Yokohama, Japan
  • fYear
    2011
  • fDate
    17-18 Nov. 2011
  • Firstpage
    28
  • Lastpage
    31
  • Abstract
    Most of MEMS (Micro Electro Mechanical Systems) actuators require high control voltage such as 20 V. One of the significant challenges for MEMS implementation on Si CMOS is that the control voltage exceeds pn-junction breakdown voltage. The present work proposes a charge pump circuit that can generate higher output voltage than the breakdown voltage by applying appropriate bias voltages to backgate and deep-N-well of N-MOSFETs. Measurements showed that the prototype can generate DC voltage of 21V in 0.18 μm Si CMOS with 11V and 15 V breakdown voltage of pn-junction.
  • Keywords
    CMOS integrated circuits; MOSFET; charge pump circuits; microactuators; p-n junctions; MEMS actuators; N-MOSFET; Si CMOS; charge pump circuit; micro electro mechanical systems; pn-junction breakdown voltage; size 0.18 mum; voltage 21 V; well-bias supply technique;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    SoC Design Conference (ISOCC), 2011 International
  • Conference_Location
    Jeju
  • Print_ISBN
    978-1-4577-0709-4
  • Electronic_ISBN
    978-1-4577-0710-0
  • Type

    conf

  • DOI
    10.1109/ISOCC.2011.6138638
  • Filename
    6138638