DocumentCode
3145551
Title
A 21 V output charge pump circuit with appropriate well-bias supply technique in 0.18 μm Si CMOS
Author
Shirane, Atsushi ; Ito, Hiroyuki ; Ishihara, Noboru ; Masu, Kazuya
Author_Institution
Solutions Res. Lab. (SSRL), Tokyo Inst. of Technol., Yokohama, Japan
fYear
2011
fDate
17-18 Nov. 2011
Firstpage
28
Lastpage
31
Abstract
Most of MEMS (Micro Electro Mechanical Systems) actuators require high control voltage such as 20 V. One of the significant challenges for MEMS implementation on Si CMOS is that the control voltage exceeds pn-junction breakdown voltage. The present work proposes a charge pump circuit that can generate higher output voltage than the breakdown voltage by applying appropriate bias voltages to backgate and deep-N-well of N-MOSFETs. Measurements showed that the prototype can generate DC voltage of 21V in 0.18 μm Si CMOS with 11V and 15 V breakdown voltage of pn-junction.
Keywords
CMOS integrated circuits; MOSFET; charge pump circuits; microactuators; p-n junctions; MEMS actuators; N-MOSFET; Si CMOS; charge pump circuit; micro electro mechanical systems; pn-junction breakdown voltage; size 0.18 mum; voltage 21 V; well-bias supply technique;
fLanguage
English
Publisher
ieee
Conference_Titel
SoC Design Conference (ISOCC), 2011 International
Conference_Location
Jeju
Print_ISBN
978-1-4577-0709-4
Electronic_ISBN
978-1-4577-0710-0
Type
conf
DOI
10.1109/ISOCC.2011.6138638
Filename
6138638
Link To Document