• DocumentCode
    3145561
  • Title

    A planar covered multi-slot-array heat applicator with beam scanning capability for interstitial microwave hyperthermia

  • Author

    Kim, Dongki ; Kim, Namgon ; Cheon, Changyul ; Kwon, Youngwoo

  • Author_Institution
    Sch. of Electr. Eng. & Comput. Sci., Seoul Nat. Univ., Seoul, South Korea
  • fYear
    2010
  • fDate
    23-28 May 2010
  • Firstpage
    1608
  • Lastpage
    1611
  • Abstract
    A planar covered multi-slot-array heat applicator with beam scanning capability is developed for interstitial microwave hyperthermia. The interstitial applicator is based on multi-slot-array structure, and beam scanning capability is added by gradual variation of the slot sizes. Through the choice of input frequencies, concentrated beam can be generated at the designed slot positions, which provides focused heating as well as additional dimension of beam control. A low permittivity dielectric cover is placed on top of the slot arrays to double in function as a protective layer and a dielectric lens which helps to flatten the wavefront to allow the microwave radiation deeper into the heating material. The measured infra-red images and thermal distributions confirm the beam scanning capability of the proposed applicator. It is also shown that the heating volume and uniformity can be improved by the proposed beam scanning applicator compared with the fixed beam applicator using uniform slot arrays.
  • Keywords
    hyperthermia; microwave heating; beam control; beam scanning capability; interstitial microwave hyperthermia; permittivity; planar covered multislot array heat applicator; slot size; thermal distribution; Applicators; Dielectrics; Electromagnetic heating; Focusing; Frequency; Hyperthermia; Microwave antenna arrays; Permittivity; Protection; Temperature control; beam scanning; covered slot; heat applicator; hyperthermia; thermal distribution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest (MTT), 2010 IEEE MTT-S International
  • Conference_Location
    Anaheim, CA
  • ISSN
    0149-645X
  • Print_ISBN
    978-1-4244-6056-4
  • Electronic_ISBN
    0149-645X
  • Type

    conf

  • DOI
    10.1109/MWSYM.2010.5517712
  • Filename
    5517712