DocumentCode
3145900
Title
Melanoma classification from Hidden Markov Tree features
Author
Duarte, Marco F. ; Matthews, Thomas E. ; Warren, Warren S. ; Calderbank, Robert
Author_Institution
Univ. of Massachusetts, Amherst, MA, USA
fYear
2012
fDate
25-30 March 2012
Firstpage
685
Lastpage
688
Abstract
Melanoma detection relies on visual inspection of skin samples under the microscope via a qualitative set of indicators, causing large discordance among pathologists. New developments in pump-probe imaging enable the extraction of melanin intensity levels from skin samples and provide baseline qualitative figures for melanoma detection and classification. However, such basic figures do not capture the diverse types of cellular structure that distinguish different stages of melanoma. In this paper, we propose an initial approach for feature extraction for classification purposes via Hidden Markov Tree models trained on skin sample melanin intensity images. Our experimental results show that the proposed features provide a mathematical microscope that is able to better discriminate cellular structure, enabling successful classification of skin samples that are mislabeled when the baseline melanin intensity qualitative figures are used.
Keywords
biomedical optical imaging; cancer; feature extraction; hidden Markov models; image classification; image sampling; medical image processing; optical microscopy; skin; wavelet transforms; baseline qualitative figures; biomedical optical imaging; cellular structure; feature extraction; hidden Markov tree features; mathematical microscopy; melanin intensity level extraction; melanoma classification; melanoma detection; pathologists; pump-probe imaging; skin samples; visual inspection; wavelet transforms; Cancer; Feature extraction; Hidden Markov models; Malignant tumors; Skin; Vectors; Wavelet transforms; Image processing; hidden Markov tree; melanoma detection and classification; wavelet transform;
fLanguage
English
Publisher
ieee
Conference_Titel
Acoustics, Speech and Signal Processing (ICASSP), 2012 IEEE International Conference on
Conference_Location
Kyoto
ISSN
1520-6149
Print_ISBN
978-1-4673-0045-2
Electronic_ISBN
1520-6149
Type
conf
DOI
10.1109/ICASSP.2012.6287976
Filename
6287976
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