DocumentCode
3146263
Title
A pseudorandom test environment
Author
Beckwith, Robert F. ; Wood, Bob ; Rioux, Bruce ; Singer, Benjamin
Author_Institution
Mint Technol. Inc., Billerica, MA, USA
fYear
1998
fDate
16-19 Mar 1998
Firstpage
153
Lastpage
157
Abstract
A pseudorandom test environment that utilizes existing self-checking directed tests is presented. A dynamic weighting scheme selects tests to run where the tests are independently configured and the configurations are subject to user constraints. To ensure reproducibility, test selection and configuration derive from a single random seed. The presented framework is capable of running several test instances concurrently. An amalgamation of tests running within the framework effectively synthesizes much more complex test scenarios, which need not be preconceived or generated in any other way. This approach provides the capability of more completely exercising a design with a pre-existing test suite. Additional features and capabilities are also discussed
Keywords
computer testing; random number generation; complex test scenarios; concurrent test instances; dynamic weighting scheme; independently configured tests; pre-existing test suite; pseudorandom test environment; random seed; reproducibility; self-checking directed tests; test configuration; test selection; user constraints; Automatic testing; Costs; Emulation; Libraries; Performance evaluation; Reproducibility of results; Runtime; Symbiosis; Turning; Yarn;
fLanguage
English
Publisher
ieee
Conference_Titel
Verilog HDL Conference and VHDL International Users Forum, 1998. IVC/VIUF. Proceedings., 1998 International
Conference_Location
Santa Clara, CA
ISSN
1085-9403
Print_ISBN
0-8186-8415-1
Type
conf
DOI
10.1109/IVC.1998.660695
Filename
660695
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