• DocumentCode
    3146345
  • Title

    Automatic Placement Algorithms for High Packing density VLSI

  • Author

    Kozawa, T. ; Terai, H. ; Ishii, T. ; Hayase, M. ; Miura, C. ; Ogawa, Y. ; Kishida, K. ; Tamada, N. ; Ohno, Y.

  • Author_Institution
    Central Research Laboratory, Hitachi Ltd, Tokyo, JAPAN
  • fYear
    1983
  • fDate
    27-29 June 1983
  • Firstpage
    175
  • Lastpage
    181
  • Abstract
    Five placement procedures which combine three basic algorithms are developed and incorporated to our system. Evaluation of results is presented. Compared with manual design the optimum procedure reduces block size by 6.5%. The normalized area for one transistor (NA) is defined as the measure of automatic layout performance. NA is the product of wiring pitch. Optimum NA is confirmed to be 14.9 for manual design and 13.9 for automatic layout using the optimum procedure. This system is applicable to both custom logic LSIs and masterslice LSIs and has been applied to layouts of many such devices.
  • Keywords
    Area measurement; Automatic logic units; Intersymbol interference; Laboratories; Logic design; Logic testing; Routing; Very large scale integration; Wire; Wiring;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation, 1983. 20th Conference on
  • ISSN
    0738-100X
  • Print_ISBN
    0-8186-0026-8
  • Type

    conf

  • DOI
    10.1109/DAC.1983.1585645
  • Filename
    1585645