Title :
Automatic Placement Algorithms for High Packing density VLSI
Author :
Kozawa, T. ; Terai, H. ; Ishii, T. ; Hayase, M. ; Miura, C. ; Ogawa, Y. ; Kishida, K. ; Tamada, N. ; Ohno, Y.
Author_Institution :
Central Research Laboratory, Hitachi Ltd, Tokyo, JAPAN
Abstract :
Five placement procedures which combine three basic algorithms are developed and incorporated to our system. Evaluation of results is presented. Compared with manual design the optimum procedure reduces block size by 6.5%. The normalized area for one transistor (NA) is defined as the measure of automatic layout performance. NA is the product of wiring pitch. Optimum NA is confirmed to be 14.9 for manual design and 13.9 for automatic layout using the optimum procedure. This system is applicable to both custom logic LSIs and masterslice LSIs and has been applied to layouts of many such devices.
Keywords :
Area measurement; Automatic logic units; Intersymbol interference; Laboratories; Logic design; Logic testing; Routing; Very large scale integration; Wire; Wiring;
Conference_Titel :
Design Automation, 1983. 20th Conference on
Print_ISBN :
0-8186-0026-8
DOI :
10.1109/DAC.1983.1585645