DocumentCode
3146682
Title
64th ARFTG Microwave Measurements Conference (IEEE Cat. No.04EX1005)
fYear
2004
fDate
2-3 Dec. 2004
Abstract
The following topics are dealt with: uncertainty; digital communications system metrics; semiconductor modeling; differential measurements; microwave measurement technique; and on-wafer technique.
Keywords
differential amplifiers; digital communication; measurement uncertainty; microwave measurement; semiconductor device models; wafer-scale integration; differential measurements; digital communications system metrics; microwave measurement technique; on-wafer technique; semiconductor modeling; uncertainty;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Measurements Conference, Fall 2004. 64th ARFTG
Conference_Location
Orlando, FL, USA
Print_ISBN
0-7803-8952-2
Type
conf
DOI
10.1109/ARFTGF.2004.1427558
Filename
1427558
Link To Document