DocumentCode :
3146790
Title :
An 85-95.2 GHz transformer-based injection-locked frequency tripler in 65nm CMOS
Author :
Chen, Zhirning ; Heydari, Payam
Author_Institution :
Nanoscale Commun. IC (NCIC) Lab., Univ. of California, Irvine, CA, USA
fYear :
2010
fDate :
23-28 May 2010
Firstpage :
776
Lastpage :
779
Abstract :
A W-band transformer-based injection-locked frequency tripler (T-ILFT) is designed and implemented in 65nm standard CMOS technology using a 0.8V supply voltage. The use of injection locking topology with on-chip transformer provides several advantages over conventional design. Occupying an chip area of 0.089mm2 (including buffers), the T-ILFT achieves an input sensitivity of -15dBm and a continuous locking range from 85 to 95.2GHz with 4dBm input power. The measured phase noise degradation from that of the input signal source is only 9.8dB at 1MHz offset. The harmonic suppressions for the first and second harmonics are measured to be 32.9dB and 38.5dB, respectively. The power consumption is only 5.2mW for T-ILFT and 14.6mW for output buffers. To the authors´ best knowledge, this T-ILFT achieves the highest operation frequency for injection-locked-based frequency multipliers, reported to date.
Keywords :
CMOS integrated circuits; frequency multipliers; network topology; transformers; CMOS technology; T-ILFT; W-band transformer-based injection-locked frequency tripler; frequency 85 GHz to 95.2 GHz; harmonic suppressions; injection locking topology; on-chip transformer; phase noise degradation; power 14.6 mW; power 5.2 mW; size 65 nm; voltage 0.8 V; CMOS technology; Degradation; Frequency; Harmonics suppression; Injection-locked oscillators; Noise measurement; Phase measurement; Phase noise; Semiconductor device measurement; Topology; CMOS; frequency generation; frequency tripler; injection-locked; millimeter wave; transformer;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest (MTT), 2010 IEEE MTT-S International
Conference_Location :
Anaheim, CA
ISSN :
0149-645X
Print_ISBN :
978-1-4244-6056-4
Electronic_ISBN :
0149-645X
Type :
conf
DOI :
10.1109/MWSYM.2010.5517773
Filename :
5517773
Link To Document :
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